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© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Accurate and reliable bearing-fault diagnosis is important for ensuring the efficiency and safety of industrial machinery. This paper presents a novel method for bearing-fault diagnosis using Mel-transformed scalograms obtained from vibrational signals (VS). The signals are windowed and pass through a Mel filter bank, converting them into a Mel spectrum. These scalograms are subsequently fed into an autoencoder comprising convolutional and pooling layers to extract robust features. The classification is performed using an artificial neural network (ANN) optimized with the FOX optimizer, which replaces traditional backpropagation. The FOX optimizer enhances synaptic weight adjustments, leading to superior classification accuracy, minimal loss, improved generalization, and increased interpretability. The proposed model was validated on a laboratory dataset obtained from a bearing testbed with multiple fault conditions. Experimental results demonstrate that the model achieves perfect precision, recall, F1-scores, and an AUC of 1.00 across all fault categories, significantly outperforming comparison models. The t-SNE plots illustrate clear separability between different fault classes, confirming the model’s robustness and reliability. This approach offers an efficient and highly accurate solution for real-time predictive maintenance in industrial applications.

Details

Title
Advanced Bearing-Fault Diagnosis and Classification Using Mel-Scalograms and FOX-Optimized ANN
Author
Muhammad Farooq Siddique 1   VIAFID ORCID Logo  ; Zaman, Wasim 1   VIAFID ORCID Logo  ; Ullah, Saif 1   VIAFID ORCID Logo  ; Umar, Muhammad 1   VIAFID ORCID Logo  ; Saleem, Faisal 1   VIAFID ORCID Logo  ; Shon, Dongkoo 2 ; Yoon, Tae Hyun 2 ; Dae-Seung Yoo 2 ; Jong-Myon Kim 1   VIAFID ORCID Logo 

 Department of Electrical, Electronics and Computer Engineering, University of Ulsan, Ulsan 44610, Republic of Korea; [email protected] (M.F.S.); [email protected] (S.U.); [email protected] (M.U.); 
 Electronics and Telecommunications Research Institute (ETRI), Daejeon 34129, Republic of Korea[email protected] (T.H.Y.); [email protected] (D.-S.Y.) 
First page
7303
Publication year
2024
Publication date
2024
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3133388371
Copyright
© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.