Abstract

We have established a method to measure picograms-per-gram (pg g−1) levels of 238U and 232Th in scintillation films by combining the dry ashing method and inductively coupled plasma mass spectrometry. Trace amounts of 238U and 232Th were measured in up to 2 g of scintillation film with almost 100% collection efficiency. This paper details the experimental procedure, including the pretreatment of the samples and labware, detection limit of the method, collection efficiencies of 238U and 232Th, and measurement of 238U and 232Th in a polyethylene naphthalate film. This method is also applicable to 238U and 232Th measurements in other low-background organic materials for rare-event search experiments.

Details

Title
Development of a Method to Measure Trace Levels of Uranium and Thorium in Scintillation Films
Author
Ichimura, K 1   VIAFID ORCID Logo  ; Chiba, K 1 ; Gando, Y 1 ; Ikeda, H 1 ; Kishimoto, Y 1 ; Kurasawa, M 1 ; Nemoto, K 1 ; Sakaguchi, A 2   VIAFID ORCID Logo  ; Takaku, Y 2 ; Sakakieda, Y 3 

 Research Center for Neutrino Science, Tohoku University , 6-3 Aoba, Aramaki, Aoba-ku, Sendai, Miyagi 980-8578 , Japan 
 Institute of Pure and Applied Sciences, University of Tsukuba , 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577 , Japan 
 Graduate School of Science and Technology, University of Tsukuba , 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577 , Japan 
Publication year
2024
Publication date
Jun 2024
Publisher
Oxford University Press
e-ISSN
20503911
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3171496217
Copyright
© The Author(s) 2024. Published by Oxford University Press on behalf of the Physical Society of Japan. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.