Details

Title
Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS
Author
Kraus, Irene; Wu, Mingjian; Rechberger, Stefanie; Will, Johannes; Maiti, Santanu; Kuhlmann, Andreas; Huck, Marten; Steinberger, Marc; Brabec, Christoph; Hans-Georg Steinrück; Unruh, Tobias; Erdmann Spiecker
Section
Diffraction Techniques and Structural Analysis
Publication year
2024
Publication date
2024
Publisher
EDP Sciences
ISSN
22731709
e-ISSN
21174458
Source type
Conference Paper
Language of publication
English
ProQuest document ID
3188752294
Copyright
© 2024. This work is licensed under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and conditions, you may use this content in accordance with the terms of the License.