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© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

What are the main findings?

An X-ray beam tracking phase-contrast imaging system based on a conventional X-ray source was experimentally demonstrated.

The method maintains high sensitivity under large focal spot conditions and enables the extraction of phase gradient information.

What is the implication of the main finding?

The system can be implemented under standard laboratory conditions.

It shows promising potential for nondestructive imaging of low-density, weakly absorbing, or biological materials.

To address the issue of insufficient contrast in conventional X-ray absorption imaging for biological soft tissues and weakly absorbing materials, this paper proposes a beam tracking X-ray phase-contrast imaging system using a conventional X-ray source. A periodic pinhole array mask is placed between the X-ray source and the sample to spatially modulate the X-ray beam, dividing it into multiple independent sub-beams. Each sub-beam is deflected due to the modulation effect of the sample, resulting in slight positional shifts in the intensity patterns formed on the detector. The experiments employ an X-ray source with a 400 μm focal spot and use a two-dimensional step-scanning approach to acquire image sequences of various samples. The experimental results show that this method can extract the edge profile and structural changes in the samples to some extent, and it demonstrates good contrast and detail recovery under weak absorption conditions. These results suggest that this method has certain application potential in material inspection, non-destructive testing, and related fields.

Details

Title
Beam Tracking X-Ray Phase-Contrast Imaging Using a Conventional X-Ray Source
Author
Li, Jiaqi 1 ; Huang Jianheng 1   VIAFID ORCID Logo  ; Liu, Xin 1 ; Yaohu, Lei 1 ; Botao, Mai 1 ; Zhang Chenggong 2 

 Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; [email protected] (J.L.); [email protected] (Y.L.); [email protected] (B.M.) 
 Institute of Advanced Light Source Facilities, Shenzhen 518107, China; [email protected] 
First page
6089
Publication year
2025
Publication date
2025
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3261088621
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.