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Channel Length Effect on Subthreshold Characteristics of Junctionless Trial Material Cylindrical Surrounding-Gate MOSFETs with High-k Gate Dielectrics
Lagraf, Fairouz; Rechem, Djamil; Kamel Guergouri; Zaabat, Mourad.
Journal of Nano- and Electronic Physics; Sumy Ukraine Vol. 11, Iss. 2, (2019).
DOI:10.21272/jnep.11(2).02011
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