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Cryo Dual Beam Focused Ion Beam-Scanning Electron Microscopy to Evaluate the Interface Between Cells and Nanopatterned Scaffolds
Lamers, Edwin; Walboomers, X Frank; Domanski, Maciej; McKerr, George; O'Hagan, Barry M
; et al.
Tissue Engineering Part C: Methods; New Rochelle Vol. 17, Iss. 1, (Jan 2011): 1-7.
DOI:10.1089/ten.tec.2010.0251
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