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© 2023. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

This article presents a framework for semi-automated building damage assessment due to earthquakes from remote-sensing data and other supplementary datasets, while also leveraging recent advances in machine-learning algorithms. The framework integrates high-resolution building inventory data with earthquake ground shaking intensity maps and surface-level changes detected by comparing pre- and post-event InSAR (interferometric synthetic aperture radar) images. We demonstrate the use of ensemble models in a machine-learning approach to classify the damage state of buildings in the area affected by an earthquake. Both multi-class and binary damage classification are attempted for four recent earthquakes, and we compare the predicted damage labels with ground truth damage grade labels reported in field surveys. For three out of the four earthquakes studied, the model is able to identify over 50 % or nearly half of the damaged buildings successfully when using binary classification. Multi-class damage grade classification using InSAR data has rarely been attempted previously, and the case studies presented in this report represent one of the first such attempts using InSAR data.

Details

Title
Earthquake building damage detection based on synthetic-aperture-radar imagery and machine learning
Author
Rao, Anirudh 1 ; Jung, Jungkyo 2   VIAFID ORCID Logo  ; Silva, Vitor 1 ; Molinario, Giuseppe 3 ; Sang-Ho, Yun 4   VIAFID ORCID Logo 

 Seismic Risk Team, Global Earthquake Model Foundation, Pavia, Italy​​​​​​​ 
 Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA​​​​​​​ 
 World Bank Group, Washington, DC, USA 
 Earth Observatory of Singapore, Nanyang Technological University, Singapore; Asian School of the Environment, Nanyang Technological University, Singapore; School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 
Pages
789-807
Publication year
2023
Publication date
2023
Publisher
Copernicus GmbH
ISSN
15618633
e-ISSN
16849981
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2778871272
Copyright
© 2023. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.