It appears you don't have support to open PDFs in this web browser. To view this file, Open with your PDF reader
Abstract
Compared with optical sensors, Synthetic Aperture Radar (SAR) can provide important damage information due to its ability to map areas affected by earthquakes independently from weather conditions and solar illumination. In 2013, a new TerraSAR-X mode named staring spotlight (ST), whose azimuth resolution was improved to 0.24 m, was introduced for various applications. This data source made it possible to extract detailed information from individual buildings. In this paper, we present a new concept for individual building damage assessment using a post-event sub-meter very high resolution (VHR) SAR image and a building footprint map. With the building footprint map, the original footprints of buildings can be located in the SAR image. Based on the building imaging analysis of a building in the SAR image, the features in the building footprint can be extracted to identify standing and collapsed buildings. Three machine learning classifiers, including random forest (RF), support vector machine (SVM) and K-nearest neighbor (K-NN), are used in the experiments. The results show that the proposed method can obtain good overall accuracy, which is above 80% with the three classifiers. The efficiency of the proposed method is demonstrated based on samples of buildings using descending and ascending sub-meter VHR ST images, which were all acquired from the same area in old Beichuan County, China.
You have requested "on-the-fly" machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Show full disclaimer
Neither ProQuest nor its licensors make any representations or warranties with respect to the translations. The translations are automatically generated "AS IS" and "AS AVAILABLE" and are not retained in our systems. PROQUEST AND ITS LICENSORS SPECIFICALLY DISCLAIM ANY AND ALL EXPRESS OR IMPLIED WARRANTIES, INCLUDING WITHOUT LIMITATION, ANY WARRANTIES FOR AVAILABILITY, ACCURACY, TIMELINESS, COMPLETENESS, NON-INFRINGMENT, MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Your use of the translations is subject to all use restrictions contained in your Electronic Products License Agreement and by using the translation functionality you agree to forgo any and all claims against ProQuest or its licensors for your use of the translation functionality and any output derived there from. Hide full disclaimer