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A Layout-Based Rad-Hard DICE Flip-Flop Design
Wang, Haibin; Dai, Xixi; Younis Mohammed Younis Ibrahim; Sun, Hongwen; Nofal, Issam
; et al.
Journal of Electronic Testing : (JETTA); Boston Vol. 35, Iss. 1, (Feb 2019): 111-117.
DOI:10.1007/s10836-019-05773-4
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