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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Recently, digital images have been considered the primary key for many applications, such as forensics, medical diagnosis, and social networks. Image forgery detection is considered one of the most complex digital image applications. More profoundly, image splicing was investigated as one of the common types of image forgery. As a result, we proposed a convolutional neural network (CNN) model for detecting splicing forged images in real-time and with high accuracy, with a small number of parameters as compared with the recently published approaches. The presented model is a lightweight model with only four convolutional layers and four max-pooling layers, which is suitable for most environments that have limitations in their resources. A detailed comparison was conducted between the proposed model and the other investigated models. The sensitivity and specificity of the proposed model over CASIA 1.0, CASIA 2.0, and CUISDE datasets are determined. The proposed model achieved an accuracy of 99.1% in detecting forgery on the CASIA 1.0 dataset, 99.3% in detecting forgery on the CASIA 2.0 dataset, and 100% in detecting forgery on the CUISDE dataset. The proposed model achieved high accuracy, with a small number of parameters. Therefore, specialists can use the proposed approach as an automated tool for real-time forged image detection.

Details

Title
A New Method to Detect Splicing Image Forgery Using Convolutional Neural Network
Author
Hosny, Khalid M 1   VIAFID ORCID Logo  ; Mortda, Akram M 2 ; Lashin, Nabil A 1   VIAFID ORCID Logo  ; Fouda, Mostafa M 3   VIAFID ORCID Logo 

 Department of Information Technology, Zagazig University, Zagazig 44519, Egypt 
 Department of Information Technology, Faculty of Information Technology and Computer Science, Sinai University, Arish 16020, Egypt 
 Department of Electrical and Computer Engineering, Idaho State University, Pocatello, ID 83209, USA 
First page
1272
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2779899526
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.