- Preview Available
- Scholarly Journal
Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED
Sang, Xiahan; Grimley, Everett D; Schenk, Tony; Schroeder, Uwe; LeBeau, James M.
Microscopy and Microanalysis, suppl. S3; Oxford Vol. 21, (Aug 2015): 779-780.
DOI:10.1017/S1431927615004699

We're sorry, there is no preview available.
Try and log in through your library or institution to see if they have access.
