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Qualify a NIR camera to detect thermal deviation during aluminum WAAM
Dellarre, Anthony; Béraud, Nicolas; Tardif, Nicolas; Vignat, Frédéric; Villeneuve, François
; et al.
The International Journal of Advanced Manufacturing Technology; Heidelberg Vol. 127, Iss. 1-2, (Jul 2023): 625-634.
DOI:10.1007/s00170-023-11587-8
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