Abstract

Photonic device development (PDD) has achieved remarkable success in designing and implementing new devices for controlling light across various wavelengths, scales, and applications, including telecommunications, imaging, sensing, and quantum information processing. PDD is an iterative, five-step process that consists of: (i) deriving device behavior from design parameters, (ii) simulating device performance, (iii) finding the optimal candidate designs from simulations, (iv) fabricating the optimal device, and (v) measuring device performance. Classically, all these steps involve Bayesian optimization, material science, control theory, and direct physics-driven numerical methods. However, many of these techniques are computationally intractable, monetarily costly, or difficult to implement at scale. In addition, PDD suffers from large optimization landscapes, uncertainties in structural or optical characterization, and difficulties in implementing robust fabrication processes. However, the advent of machine learning over the past decade has provided novel, data-driven strategies for tackling these challenges, including surrogate estimators for speeding up computations, generative modeling for noisy measurement modeling and data augmentation, reinforcement learning for fabrication, and active learning for experimental physical discovery. In this review, we present a comprehensive perspective on these methods to enable machine-learning-assisted PDD (ML-PDD) for efficient design optimization with powerful generative models, fast simulation and characterization modeling under noisy measurements, and reinforcement learning for fabrication. This review will provide researchers from diverse backgrounds with valuable insights into this emerging topic, fostering interdisciplinary efforts to accelerate the development of complex photonic devices and systems.

Details

Title
Machine-learning-assisted photonic device development: a multiscale approach from theory to characterization
Author
Chen, Yuheng 1 ; Alexander Montes McNeil 2   VIAFID ORCID Logo  ; Park, Taehyuk 3 ; Wilson, Blake A 1 ; Iyer, Vaishnavi 1 ; Bezick, Michael 4 ; Jae-Ik Choi 1 ; Ojha, Rohan 4 ; Mahendran, Pravin 4 ; Singh, Daksh Kumar 1 ; Chitturi, Geetika 4 ; Chen, Peigang 1 ; Do, Trang 4 ; Kildishev, Alexander V 4 ; Shalaev, Vladimir M 1 ; Moebius, Michael 5 ; Cai, Wenshan 6 ; Liu, Yongmin 7 ; Boltasseva, Alexandra 1 

 Elmore Family School of Electrical and Computer Engineering, Birck Nanotechnology Center, and Purdue Quantum Science and Engineering Institute, Purdue University, West Lafayette, IN 47907, USA; Quantum Science Center, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA 
 Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA; Draper Scholar, The Charles Stark Draper Laboratory, Inc., Cambridge, MA 02139, USA 
 School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA 
 Elmore Family School of Electrical and Computer Engineering, Birck Nanotechnology Center, and Purdue Quantum Science and Engineering Institute, Purdue University, West Lafayette, IN 47907, USA 
 The Charles Stark Draper Laboratory, Inc., Cambridge, MA 02139, USA 
 School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA; School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA 
 Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA; Department of Mechanical and Industrial Engineering, Northeastern University, Boston, MA 02115, USA 
Pages
3761-3793
Publication year
2025
Publication date
2025
Publisher
Walter de Gruyter GmbH
ISSN
21928606
e-ISSN
21928614
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3271915129
Copyright
© 2025. This work is published under http://creativecommons.org/licenses/by/4.0 (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.