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Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)
Koblischka-Veneva, A; Koblischka, M R; Schmauch, J; Mitra, A; Panda, A K.
Journal of Physics: Conference Series; Bristol Vol. 200, Iss. 8, (Jan 2010).
DOI:10.1088/1742-6596/200/8/082013
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