It appears you don't have support to open PDFs in this web browser. To view this file, Open with your PDF reader
Abstract
We present computer simulations of a two-way ANOVA gage R&R study to determine the effects on the average speckle width of intensity patterns caused by scattered light reflected from random rough surfaces with different statistical characteristics. We illustrate how to obtain reliable computer data that properly simulate experimental measurements by means of the Fresnel diffraction integral, which represents an accurate analytical model for calculating the propagation of spatially-limited coherent beams that have been phase-modulated after being reflected by the vertical profiles of the generated surfaces. For our description we use four differently generated vertical profiles and five different vertical randomly generated roughness values.
You have requested "on-the-fly" machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Show full disclaimer
Neither ProQuest nor its licensors make any representations or warranties with respect to the translations. The translations are automatically generated "AS IS" and "AS AVAILABLE" and are not retained in our systems. PROQUEST AND ITS LICENSORS SPECIFICALLY DISCLAIM ANY AND ALL EXPRESS OR IMPLIED WARRANTIES, INCLUDING WITHOUT LIMITATION, ANY WARRANTIES FOR AVAILABILITY, ACCURACY, TIMELINESS, COMPLETENESS, NON-INFRINGMENT, MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Your use of the translations is subject to all use restrictions contained in your Electronic Products License Agreement and by using the translation functionality you agree to forgo any and all claims against ProQuest or its licensors for your use of the translation functionality and any output derived there from. Hide full disclaimer