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Herndon, VA-The International Electronics Manufacturing Initiative (INEMI) announced the availability of two documents intended to help manufacturers reduce the risk of tin whiskers in leadfree products. The first is JEDEC standard JESD22A121,"Test Method for Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes." The second is the updated "Recommendations on Lead-Free Finishes for Components Used in High-Reliability Products,"from the INEMI Tin Whisker User Group.
JEDEC Whisker Growth Test Method
The JEDEC standard, published this month, details a suite of tests that provide: an industry-standard method of measuring and comparing whisker propensity for different plating or finish...